Now, I have done some quick readings around and know that EM is that thing that ruins your CPU, especially when you OC and it increases with heat and voltage. Until here it's OK but nobody mentions frequency; does frequency increase accelerate EM anyhow or does it not?
Ok, here we go.....
First, in doing a search I found a 'term paper' on a college server by some student it appears that actually did a great job summarizing the whole electromigratin thing, I really like this paper as it does a good job going into basic detail without a huge technical overhead:
http://www.eng.uwaterloo.ca/~asultana/Project_ECE730vlsi.pdf
Particularly, see figure 2-1 on page 12, it essentially summarizes electromigration in a simple picture. I will refer to this PDF in this reply.
Other articles on electromigration to get the intresest going (some are subscription based, but a library would also have them):
http://pmos.upc.es/blues/publications/ICTesting/JLG_MR_37_7_97.PDF
http://ieeexplore.ieee.org/search/wrapper.jsp?arnumber=1044338
http://www.mrs.org/s_mrs/sec_subscribe.asp?CID=2467&DID=141052&action=detail
And my favorite:
http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=1493069
This one concerns ESD induced electromigration failures as latent ESD failures that can shorten the lifetime to as little as a few weeks.
Ok, now to the answer ----
The answer is actually simpler than you think.... the short of it is, increasing frequency also increases the total current through the device, hence, the metal lines will experience higher current density and higher electromigration degradation.
Here is the explanation .... those who have watch me post know I am keen on the td=CV/I, where td is gate delay, C is total capacitance, V of course is voltage, and I is current or Idsat, drive current. This is a fundamental equation describing the max switching speed of a device. However, in this form and this way of thinking td is the dependent variable and is a function of C, V, and I -- all three of which are design parameters, what happens after we have optimized the process and nothing changes any longer --- then we rearrange this equation and, in this case, let's look at I as the independent variable:
I = CV/td or CV*(1/td)
But 1/td is one over time which is frequncy, f. So ---
I = CV*f
Thus, since C is fixed by the oxides, wires, and transistors in the CPU, V is dialed by you the user, and f is set by the clock generator, then I is a direct function of frequency AND voltage.
In the link above, electromigration lifetimes are modeled by Black's equation (see link above):
tf = A * (1/J)^n * EXP(Ea/kT)
A is material dependent, J is the current density which is I/unit area cross section of the wire, n is a emperically determined exponent, Ea is activation energy, k is the Boltzmann constant, and T is temperature. Key here is current density J as the current goes up so does the electromigration factor.
So really, the increase of electromigration with frequency is no more than an increase in current driven by the frequency generator. Pretty simple.
Side note: Validate my I = CV*f equation, recall that I also post many times that the equation for dynamic power is P=CV^2*f , well with a little algrebra check this out ---
P = I*V ===> fundamental electrical power equation.
Substitute the expression for current as a function of frequency from my argument above,
P = (CV*f)*V = C*V^2*f wow, now we see where the dynamic power equation comes from and that power really goes as a cube of the 'speed fundamental varibles --- 2 orders in voltage and 1 order in frequency.
EDIT: NOTE --- though volting and clocking up your CPU can increase the rate of electromigration, the time scale here is still VERY long. Pausert20 is correct, the heavier Cu atoms, the lower resistance and lower temperature of the wire as a result has pretty much eliminated electromgiration problems, they still exist but the lifetime is so long that it makes littel difference based on the turn over rate that we typically upgrade to.... (We meaning enthusiast).
TDDB is probably the most common failure mode if suiciding a chip.
http://www.dfrsolutions.com/page.asp?id=114&mstr=4
Notice that it has the same exponential form as electromigration, they are both first order affects.
Jack
I'm just curious, but... what do you for for a living??