Nanoscopic 'ruler' could provide microchip benchmark

A nanoscopic measuring device that uses atomic lattices to gauge tiny distances could enable microelectronics engineers to build better components, say US scientists.

The "nanoruler" was developed by researchers at the US government's National Institute of Standards and Technology (NIST) in Maryland, US, and industry collaborators.

Read the complete story . (New Scientist)

Create a new thread in the US News comments forum about this subject
This thread is closed for comments
No comments yet
    Your comment