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Nanoscopic 'ruler' could provide microchip benchmark

By - Source: Tom's Hardware US | B 0 comment

A nanoscopic measuring device that uses atomic lattices to gauge tiny distances could enable microelectronics engineers to build better components, say US scientists.

The "nanoruler" was developed by researchers at the US government's National Institute of Standards and Technology (NIST) in Maryland, US, and industry collaborators.

Read the complete story . (New Scientist)

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