Intel In-Field Scan Feature in Sapphire Rapids Pinpoints Per-Core Errors

Sapphire Rapids
(Image credit: Los Alamos National Laboratory)

Intel posted a new Linux driver yesterday that surfaced an interesting new feature coming to Sapphire Rapids server processors. The feature takes silicon integrity and reliability checks to the next level and is dubbed In-Field Scan. Phoronix spotted the new Linux driver and highlighted the importance of defect discovery in server processors prior to deployment or before working on critical tasks.

Servers already boast parity or ECC checks as standard features for RAM, and there are similar checks on data going to and from storage, across networks, and more. However, the new In-Field Scan feature specifically targets the processor. To get the new In-Field Scan system to work, Intel Sapphire Rapids Xeon CPUs will have integrated checking features, and the In-Field Scan kernel driver will provide a user interface for the checks.

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Mark Tyson
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Mark Tyson is a news editor at Tom's Hardware. He enjoys covering the full breadth of PC tech; from business and semiconductor design to products approaching the edge of reason.