Nanoscopic 'ruler' could provide microchip benchmark

A nanoscopic measuring device that uses atomic lattices to gauge tiny distances could enable microelectronics engineers to build better components, say US scientists.

The "nanoruler" was developed by researchers at the US government's National Institute of Standards and Technology (NIST) in Maryland, US, and industry collaborators.

TOPICS

Wolfgang Gruener is an experienced professional in digital strategy and content, specializing in web strategy, content architecture, user experience, and applying AI in content operations within the insurtech industry. His previous roles include Director, Digital Strategy and Content Experience at American Eagle, Managing Editor at TG Daily, and contributing to publications like Tom's Guide and Tom's Hardware.